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|Additional Physical Format:||Print version:
Levinshteĭn, M.E. (Mikhail Efimovich).
Breakdown phenomena in semiconductors and semiconductor devices.
New Jersey ; London : World Scientific, c2005
|Material Type:||Document, Internet resource|
|Document Type:||Internet Resource, Computer File|
|All Authors / Contributors:||
M E Levinshteĭn; Juha Kostamovaara; Sergey Vainshtein
|ISBN:||9812563954 9789812563958 9812703330 9789812703330|
|Description:||1 online resource (xiii, 208 p.) : ill.|
|Contents:||Preface; Contents; Chapter 1 Introductory Chapter; Chapter 2 Avalanche Multiplication; Chapter 3 Static Avalanche Breakdown; Chapter 4 Avalanche Injection; Chapter 5 Dynamic Breakdown; Conclusion; List of Symbols; Bibliography; Index; AUTHOR INDEX;|
|Series Title:||Selected topics in electronics and systems, v. 36.|
|Responsibility:||Michael Levinshtein, Juha Kostamovaara, Sergey Vainshtein.|
Aims to summarize the main experimental results on avalanche and breakdown phenomena in semiconductors and semiconductor devices, and to analyze their features from a unified point of view. This book focuses on the phenomenology of avalanche multiplication and the various kinds of breakdown phenomena and their qualitative analysis.
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